Wroclaw University of Science and Technology
The optical profilometer bench is used for advanced measurements of topographic parameters of surfaces subjected to various types of treatment in a wide range of measurement scales. Thanks to the high imaging resolution and digital processing of the stand, it is possible to create images of surfaces with depths inaccessible to classical optical microscopy with sub-micrometer resolutions, enabling the measurement of shapes, surface roughness. Complementing the stand is an atomic force microscope that allows measurement of surface profiles with sub-nanometer resolution.
0000-0002-7585-0910
